Micro/Nano Processing Technology¶
Course Overview¶
- Institution: MIT
- Course code: 6.152J
- Track: Micro/Nanofabrication and MEMS
- Tier: S
- Role: Mainline
- Level: Not standardized by provider (use prerequisites)
- Last reviewed: 2026-07-28
MIT's Micro/Nano Processing Technology builds a micro- and nanofabrication theory spine through notes, practice, and exams, with cleanroom work restricted to case-study or virtual-process learning.
Why choose this course
Mainline course. A particularly complete and well-structured option for this track. Review note: S theory / A laboratory access
Before you start
- Recommended foundation: Semiconductor Devices
- Recommended foundation: Physics Foundations
Verifiable learning outcomes
- Explain the core models in Micro/Nanofabrication and MEMS, including their assumptions and limits
- Solve representative derivations and problems, checking units, limiting cases, or numerical results
- Complete a reproducible experiment or implementation with raw data, parameters, versions, and verification
Workload and pacing
13 weeks at 9 hours/week. This maintainer planning estimate is derived from course role and the density of public practice and labs; it is not a provider workload promise. Pilot two weeks while logging instruction, practice, lab, and review time, then adjust the remaining plan when actual effort differs by more than 25%.
Safety level
Simulation only. The default practice scope is software, computation, or simulation only; a lab label in the resource inventory does not authorize connecting physical equipment, and any hardware extension requires provider-scope verification and a new risk assessment.
Course Resources¶
Software, hardware, and cost
Software
- Maintainer-suggested open-source/free verification path: KLayout, gdsfactory, Python 3, and Jupyter
- The resource inventory does not list public code coverage; the tools above are only a maintainer-suggested independent check, not a provider requirement
Hardware
- The resource inventory lists lab coverage, but this course's maintainer path explicitly limits it to computational or simulation work. It assumes only a general-purpose computer able to run the software above and retain results; do not purchase or connect institution-approved cleanroom, process tools, metrology, and personal protective equipment; do not substitute home purchases
Cost note
The current maintainer path uses computation and simulation only, with no dedicated hardware purchase, and prefers open-source/free tools. This is not a provider requirement; platform, commercial-software, or cloud-compute costs still vary by provider, region, and plan.
Public resource coverage
| Resource type | Completeness |
|---|---|
| Video | No public material |
| Notes | Complete |
| Practice | Complete |
| Labs | Partial |
| Exams | Complete |
| Code | No public material |
Resources and access
| Resource | Access | License | Status | Verified |
|---|---|---|---|---|
| Course home | Open access | CC BY-NC-SA 4.0 for site materials; third-party exclusions may apply | Listed by official page | 2026-07-28 |
| Assignments | Open access | CC BY-NC-SA 4.0 for site materials; third-party exclusions may apply | Listed by official page | 2026-07-28 |
| Syllabus | Open access | CC BY-NC-SA 4.0 for site materials; third-party exclusions may apply | Listed by official page | 2026-07-28 |
| Exams | Open access | CC BY-NC-SA 4.0 for site materials; third-party exclusions may apply | Listed by official page | 2026-07-28 |
| Labs | Open access | CC BY-NC-SA 4.0 for site materials; third-party exclusions may apply | Listed by official page | 2026-07-28 |
| Calendar | Open access | CC BY-NC-SA 4.0 for site materials; third-party exclusions may apply | Listed by official page | 2026-07-28 |
| Lecture Notes | Open access | CC BY-NC-SA 4.0 for site materials; third-party exclusions may apply | Listed by official page | 2026-07-28 |
| Lecture 1 (PDF) | Open access | CC BY-NC-SA 4.0 for site materials; third-party exclusions may apply | Listed by official page | 2026-07-28 |
| Lecture 10 (PDF) | Open access | CC BY-NC-SA 4.0 for site materials; third-party exclusions may apply | Listed by official page | 2026-07-28 |
| Lecture 17 (PDF) | Open access | CC BY-NC-SA 4.0 for site materials; third-party exclusions may apply | Listed by official page | 2026-07-28 |
| Lecture 2 (PDF) | Open access | CC BY-NC-SA 4.0 for site materials; third-party exclusions may apply | Listed by official page | 2026-07-28 |
“Listed by official page” means the link was discovered on a successfully fetched official source on the verification date; it does not guarantee that every region or account can open the target directly. Access does not grant redistribution rights. Re-check the provider page, target link, and third-party notices before downloading, adapting, or publishing material.
Practice and Verification¶
Practice loop
Micro/Nano Processing Technology · MIT 6.152J: MEMS Process-Flow and Tolerance Digital Validation
This is a maintainer-suggested self-study project for Micro/Nano Processing Technology · MIT 6.152J, not an official course assignment. Propose a virtual MEMS or microfabricated structure and process flow for Micro/Nanofabrication and MEMS, then simulate geometry, residual stress, etch bias, and failure margin.
Origin: Maintainer-suggested project
Deliverables
- Device cross section, mask layers, materials, process sequence, design rules, and risk analysis
- Parameterized geometry or finite-element model and process-tolerance sweep sources
- Raw displacement, frequency, stress, thermal or fluid results and at least 100 tolerance samples
- A report defining process window, yield proxy, failure modes, and layout correction
Verification
- Keep the nominal key response within 10% of a simplified beam or membrane analytic model
- Cover minimum feature, maximum etch bias, material extremes, and contact or buckling boundaries
- After mesh refinement, keep the key metric change below 5% and report energy or force balance
- Inject residual stress or mask misalignment and locate the first design-rule or performance failure
Reproducibility
- Commit cross-section or mask, parametric geometry, solver, sweep, and post-processing sources
- Pin solver, material library, meshing rules, process parameters, and tolerance seeds
- Preserve raw field and geometry data, solver logs, and the generated report
Safety boundary: Simulation only — Use process planning and simulation only; do not use chemicals, vacuum, plasma, lithography, cleanroom equipment, or physical micromechanical structures.
Risks, gaps, and boundaries
Cleanroom work can only be a case study or virtual process for independent learners and must not be described as a home laboratory.
Completion evidence
- Weekly learning log with time, questions, corrected errors, decisions, next steps, and links to that week's reproducible artifacts
- Design-review package with requirements and constraints, trade-offs, editable sources, applicable ERC/DRC/timing/stability checks, exports, and a reproduction test
- Simulation package with model or netlist, inputs, solver and version, parameter-sweep script, benchmark comparison, expected results, and one rerun command